Peer Review History: AI-Driven Wafer Inspection: Deep Learning, Transformers, and Generative Models for Defect Analysis in Semiconductor Manufacturing

Editor(s):

(1) Dr. Xingting Wang, Louisiana State University, USA.

Approved by:

(1) Prof. Yasuhiko Kamiyama, University of the Ryukyus, Japan.

Reviewers:

(1) Muhammad Johirul Islam, United International University, Bangladesh.

(2) S.Vijaya Peterraj, University of Madras, India.

(3) Anil Kumar Chikatimarla, AG & SG Siddhartha Degree College of Arts & Science, India.

Additional Reviewers:

(1) Devaraj Verma C, Jain (Deemed to be University), India.

(2) Dontabhaktuni Jayakumar, VIT-AP University, India.

(3) G.Vidhya, Annamalai University, India.

(4) K.Gandhimathi, PSGR Krishnammal College for Women, India.

(5) N.Venkateswaran, Jyothishmathi Institute of Technology and Science (Autonomous), India.

(6) Rajib Nandee, Dhaka University of Engineering & Technology, Bangladesh.

Peer Review History:


Peer review report_1 (Muhammad Johirul Islam, Bangladesh) | File 1 | NA


Peer review report_2 (S.Vijaya Peterraj, India) | File 1 | NA


Peer review report_3 (Anil Kumar Chikatimarla, India) | File 1 | NA


Comment_ Academic Editor_1_v1 | File 1 | NA


Comment_ Book Editor_1 | File 1 | NA


Posted in Review History.