Peer Review History: A Synthetic CAD-to-SEM Pipeline for Design-Based Semiconductor Defect Detection Using Structural Similarity Analysis

Editor(s):

(1) Prof. Figen Balo, Firat University, Turkey.

Approved by:

(1) Dr. D.B. Jani, Gujarat Technological University, India.

Reviewers:

(1) Suman Thapaliya, Lincoln University College, Nepal.

(2) Mohammad Siddique, BUITEMS, Pakistan.

Additional Reviewers:

(1) Srinivasa Rao Challa, Charles Schwab, USA.

(2) Subramaniam Jahanadan, Kolej Matrikulasi Labuan, Malaysia.

(3) Wael Abdulhasan Atiyah, Iraq.

Peer Review History:


Peer review report_1 (Suman Thapaliya, Nepal) | File 1 | NA


Peer review report_2 (Mohammad Siddique, Pakistan) | File 1 | NA


Comment_ Academic Editor_1_v1 | File 1 | NA


Comment_ Book Editor_1 | File 1 | NA


Posted in Review History.