Peer Review History: Local Features Matching Assistance-Based Image Forgery Detection

Editor(s):

(1) Prof. Shi-Hai Dong, National Polytechnic Institute, Mexico.

Approved by:

(1) Prof. G. Sudheer, Professor, GVP College of Engineering for Women, Madhurawada, Visakhapatnam, India.

Reviewers:

(1) S. Velmurugan, Kongunadu Arts and Science College, India.

(2) S. Dhivya, Sri Manakula Vinayagar Engineering College, India.

Additional Reviewers:

Additional Reviewers: (Comments received after deadline)

Peer Review History:


Peer review report_1 (S. Velmurugan, India) | File 1 | NA


Peer review report_2 (S. Dhivya, India) | File 1 | NA


Comment_Academic_Editor | File 1 | NA


Comment_Book_Editor | File 1 | NA