Peer Review History: Thickness-Dependent Optical Properties and Exciton-Polariton States in Microcavities Based on Nanocrystalline SIC Films

Editor(s):

(1) Prof. Rachid Masrour, Sidi Mohamed Ben Abdellah University, Morocco.

Approved by:

(1) Dr. Francisco Welington de Sousa Lima, Universidade Federal do PiauĂ­, Brazil.

Reviewers:

(1) Deepshikha Rathore, Alliance University, India.

(2) Hamid Mohammed Mahan, Middle Technical University, Iraq.

(3) Ch Jayaprakash, Sir Crreddy College Of Engineering, India.

Additional Reviewers:

Additional Reviewers: (Comments received after deadline)

Peer Review History:


Peer review report_1 (Deepshikha Rathore, India) | File 1 | NA


Peer review report_2 (Hamid Mohammed Mahan, Iraq) | File 1 | NA


Peer review report_3 (Ch Jayaprakash, India) | File 1 | NA


Comment_Academic_Editor_1 | File 1 | NA


Comment_Book_Editor_1 | File 1 | NA


Posted in Review History.